album cover
Test Pattern
374
De gira
Alternative
Test Pattern fue publicado el 23 de noviembre de 2010 por Run For Cover Records como parte del álbum Two Worlds
album cover
Fecha de lanzamiento23 de noviembre de 2010
SelloRun For Cover Records
IdiomaEnglish
Melodicidad
Acústico
Valence
Bailabilidad
Energía
BPM90

Letras

I tried so hard
To be the one that you would think about
On your train ride back home
You told me you would like me better if I didn't always try so hard
And I don't feel so invincible anymore
And I don't feel so invincible anymore
Written by: Benjamin Francis Walsh
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