album cover
Test Pattern
374
巡演
Alternative
Test Pattern 由 Run For Cover Records 於 2010年11月23日發行,收錄於專輯《Two Worlds》中
album cover
發行日期2010年11月23日
標籤Run For Cover Records
語言English
旋律
原聲音質
Valence
節奏感
輕快
BPM90

歌詞

I tried so hard
To be the one that you would think about
On your train ride back home
You told me you would like me better if I didn't always try so hard
And I don't feel so invincible anymore
And I don't feel so invincible anymore
Written by: Benjamin Francis Walsh
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